The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[18p-231A-1~14] 1.5 Instrumentation, measurement and Metrology

Tue. Sep 18, 2018 1:15 PM - 5:30 PM 231A (231-1)

Nao Terasaki(AIST), Hiromasa Tokudome(TOTO)

3:15 PM - 3:30 PM

[18p-231A-9] Polarization dependence in 3D geometry measurement using 3D laser scanners

Chao Zhang1, Neisei Hayashi1, Lei Jin1, Sze Yun Set1, Shinji Yamashita1 (1.RCAST Tokyo Univ.)

Keywords:3D geometry measurement, Laser scanner, Polarization

The AMCW LiDAR illuminates 3D objects with amplitude-modulated laser beams and measures the phase shift of the envelopes of the reflected light. High-precision 3D geometry measurement with comparatively long measurement distance can thus be realized. Therefore, the AMCW LiDAR is suited for 3D geometry measurement of industrial inspection. Generally, the surfaces of industrial products are fine-textured. The 3D geometry measurement using such a laser scanner is polarization dependent since scattering characteristics vary with polarization states of the polarized illumination light. In this article, we report the polarization dependence of the 3D geometry measurement using AMCW LiDAR.