The 79th JSAP Autumn Meeting, 2018

Presentation information

Poster presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[18p-PA4-1~20] 3.8 Optical measurement, instrumentation, and sensor

Tue. Sep 18, 2018 4:00 PM - 6:00 PM PA (Event Hall)

4:00 PM - 6:00 PM

[18p-PA4-16] Electrical characteristics of CaF2-metal interface under vaccum ultraviolet irradiation

Kentaro Suzuki1, Jun Otani1, Shigo Ono1, Masahiko Kase2 (1.NITech, 2.USHIO INC.)

Keywords:fluoride, VUV detector

In this presentation we report the development of a vacuum ultraviolet detector capable of operating at zero bias by contacting the CaF2 single crystal and the metal. For the fabrication of the device, we deposited a thin film of Au and Al on both surfaces of a CaF2 single crystal by vacuum evaporation method. Also, the Au electrode was deposited very thin to make it function as a transparent electrode. As a result, we succeeded in acquisition of wavelength sensitivity characteristics and measurement of pulsed light source at zero bias.