【Highlighted Presentation】Characterization of Frequency Dispersion of Non-180&deg Domain Switching in Rhombohedral PZT by Time-Resolved Synchrotron Radiation X-ray diffraction

Takao Shimizu; Yoshitaka Ehara; Takanori Mimura; Shintaro Yasui; Tomoaki Yamada; Yasuhiko Imai; Yoshio Katsuya; Osami Sakata; Hiroshi Funakubo

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.1 Ferroelectric thin films

[19a-133-1~12] 6.1 Ferroelectric thin films

Wed. Sep 19, 2018 9:00 AM - 12:15 PM 133 (133+134)

Shintaro Yasui(Tokyo Tech), Takashi Nakajima(Tokyo Univ. of Sci.)

12:00 PM - 12:15 PM

[19a-133-12] 【Highlighted Presentation】Characterization of Frequency Dispersion of Non-180° Domain Switching in Rhombohedral PZT by Time-Resolved Synchrotron Radiation X-ray diffraction

〇Takao Shimizu¹, Yoshitaka Ehara¹, Takanori Mimura¹, Shintaro Yasui¹, Tomoaki Yamada², Yasuhiko Imai³, Yoshio Katsuya⁴, Osami Sakata⁴, Hiroshi Funakubo¹ (1.Tokyo Tech, 2.Nagoya Univ., 3.JASRI, 4.NIMS)

Keywords:lead zirconate titanate, Time resolved XRD