The 79th JSAP Autumn Meeting, 2018

Presentation information

Print

Oral presentation

17 Nanocarbon Technology » 17.3 Layered materials

[19a-311-1~12] 17.3 Layered materials

Wed. Sep 19, 2018 9:00 AM - 12:15 PM 311 (Cascade)

Tomoki Machida(Univ. of Tokyo)

10:15 AM - 10:30 AM

△ [19a-311-6] Gated Four-Probe Method for Evaluation of Electrical Characteristics in MoS2 Field-Effect Transistors

〇(M2)Tomoaki Oba1, Takamasa Kawanago1, Syunri Oda1 (1.Tokyo Tech QNERC)

Keywords:MoS2, Gated Four-Probe Method