Carrier lifetime evaluation of Mg<sub>2</sub>Si-PDs by OCVD method

Presentation information

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

Wed. Sep 19, 2018 1:45 PM - 6:45 PM 436 (436)

Haruhiko Udono(Ibaraki Univ.), Yoshikazu Terai(Kyushu Inst. of Tech.), Kenji Yamaguchi(QST), Kosuke Hara(Univ. of Yamanashi)

3:45 PM - 4:00 PM

〇Fumiya Takahashi¹, Daisuke Niioka¹, Haruhiko Udono¹ (1.Ibaraki Univ.)

Keywords:semiconductor, Mg2Si, IR detector