The 79th JSAP Autumn Meeting, 2018

Presentation information

Poster presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[19p-PA6-1~6] 1.5 Instrumentation, measurement and Metrology

Wed. Sep 19, 2018 4:00 PM - 6:00 PM PA (Event Hall)

4:00 PM - 6:00 PM

[19p-PA6-5] Deveropment of the lectron filter for SEM in-situ creep testing

〇(M1)Daichi Ishige1, Ichitaka Ikeda1, Hirosi Suga1 (1.CIT)

Keywords:In situ observation

In this research, in order to establish an in-situ observation technique of creep deformation process using SEM, a creep deformation test method using wire specimen and a method of creep deformation using a two-piece electrode Verify the effect and perform creep deformation scanning electron microscopy in situ observation