Change in Resistance of a Ag/Ta<sub>2</sub>O<sub>5</sub>/Pt Device by Constant Bias Application

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

Wed. Sep 19, 2018 1:30 PM - 3:30 PM PB (Shirotori Hall)

1:30 PM - 3:30 PM

〇(M2)Yuki Shigeoka¹, Tsuyoshi Hasegawa¹ (1.Waseda Univ.)

Keywords:ReRAM