Tuning Up or Down the Critical Thickness in LaAlO<sub>3</sub>/SrTiO<sub>3</sub> through In-Situ Deposition of Metal Overlayers

Hiroshi Naganuma; Diogo Castro Vaz; Edouard Lesne; Anke Sander; Eric Jacquet; Jacobo Santamaria; Agnes Barthelemy; Manuel Bibes

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[19p-PB1-1~37] 6.3 Oxide electronics

Wed. Sep 19, 2018 1:30 PM - 3:30 PM PB (Shirotori Hall)

1:30 PM - 3:30 PM

[19p-PB1-36] Tuning Up or Down the Critical Thickness in LaAlO₃/SrTiO₃ through In-Situ Deposition of Metal Overlayers

〇Hiroshi Naganuma^1,2, Diogo Castro Vaz², Edouard Lesne², Anke Sander², Eric Jacquet², Jacobo Santamaria³, Agnes Barthelemy², Manuel Bibes² (1.Tohoku Univ., 2.CNRS/Thales, 3.Complutense Madrid)

Keywords:LaAlO3/SrTiO3, 2DEG

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Presentation information

[19p-PB1-1~37] 6.3 Oxide electronics

[19p-PB1-36] Tuning Up or Down the Critical Thickness in LaAlO3/SrTiO3 through In-Situ Deposition of Metal Overlayers

[19p-PB1-36] Tuning Up or Down the Critical Thickness in LaAlO₃/SrTiO₃ through In-Situ Deposition of Metal Overlayers