The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.3 Bulk, thin-film and other silicon-based solar cells

[20a-133-1~8] 16.3 Bulk, thin-film and other silicon-based solar cells

Thu. Sep 20, 2018 9:30 AM - 11:45 AM 133 (133+134)

Katsuhiko Shirasawa(AIST)

9:30 AM - 9:45 AM

[20a-133-1] Investigation of the correlation between crystal orientations and reflection behaviors of multiclystalline silicon by approaching of data science

〇(M1)Soichiro Kamibeppu1, Tetsuya Matsumoto2, Kentaro Kutsukake3, Hiroaki Kudo2, Noritaka Usami1 (1.Graduate School of Engineering, Nagoya Univ., 2.Graduate School of Informatics, Nagoya Univ., 3.Institutes of Innovation for Future Society, Nagoya Univ.)

Keywords:Data Science, Crystal Orientation, MultiCrystalline Silicon

Currently, multicrystalline Si(mc-Si) solar cells, which are the mainstream of solar cells, takes a long time to measure distribution of crystal orientation. In this research, in order to reduce measurement time of crystal orientations of mc-Si wafers by approaching of data science, we tried to identify the correlation between crystal orientations and the reflection behaviors of crystal grains in optical images. Before taking optical images, treatment was performed such that crystal grains form surface states with different reflectance for each crystal orientation. As a result of taking the optical images under different lighting conditions, reflection behaviors had features for each crystal orientation.