The 79th JSAP Autumn Meeting, 2018

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Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[20a-PA4-1~12] 13.2 Exploratory Materials, Physical Properties, Devices

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

9:30 AM - 11:30 AM

[20a-PA4-7] Evaluation of the MgSi/Si Junction’s Band Offset by Hard X-ray Photoelectron Spectroscopy

〇Ryota Karakama1, Yuta Iwanami1, Yan Wu1, Kuniyuki Kakushima2, Yoshihiro Takahashi1 (1.Nihon Univ., 2.Tokyo Inst.)

Keywords:Hard X-ray Photoelectron Spectroscopy, TFET, MgSi/Si