[20p-143-1~12] 11.2 Thin and thick superconducting films, coated conductors and film crystal growth

[20p-143-12] Highly Accurate Analysis of Complex Refraction Index of Superconducting Metals

〇(P)Toshio Konno¹, Sachiko Takasu¹, Daiji Fukuda¹ (1.AIST)

Keywords:superconducting transition edge sensor, TES, thin film

Superconducting transition edge sensors (TES) composed of superconducting thin films are avalable for calorimeters with large thermal sensitivity and high energy resolution. Our objective is to achieve high quantum efficiency in optical wavelength to near-infrared wavelength using TES as a calorimeter. In this study, we conducted analysis of complex refraction index of Ti single layer using multi-layer thin film model to obtain high accurate values. We will conduct simulation using the values to conduct preparing and measurement of an optical cavity structure with high quantum efficiency.