The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[21a-135-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Fri. Sep 21, 2018 9:00 AM - 11:45 AM 135 (135)

Nobuya Mori(Osaka Univ.)

9:45 AM - 10:00 AM

[21a-135-4] Effect of Fowler-Nordheim current on MOS capacitive sensor

Takuya Sobue1, Shunsuke Kuramoto1, Kazuki Hagiwara1, Takahisa Tanaka1, Ken Uchida1 (1.Faculty of Sci. & Tech., Keio Univ.)

Keywords:hydrogen sensor, MOS capacitor, palladium