Internal Electric-Field Imaging of Power Devices Using Nitrogen-Vacancy Centers in Diamond

Kwangsoo Kim; Kosuke Mizuno; Toshiharu Kato; Hiromitsu Kato; Masahiko Ogura; Daisuke Takeuchi; Satoshi Yamasaki; Mutsuko Hatano; Takayuki Iwasaki

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[21a-232-1~12] 6.2 Carbon-based thin films

Fri. Sep 21, 2018 9:00 AM - 12:00 PM 232 (232)

Kazuhiro Oyama(DENSO), Toyofumi Ishikawa(AIST)

9:45 AM - 10:00 AM

△ [21a-232-4] Internal Electric-Field Imaging of Power Devices Using Nitrogen-Vacancy Centers in Diamond

〇Kwangsoo Kim¹, Kosuke Mizuno¹, Toshiharu Kato², Hiromitsu Kato², Masahiko Ogura², Daisuke Takeuchi², Satoshi Yamasaki², Mutsuko Hatano¹, Takayuki Iwasaki¹ (1.Tokyo Tech, 2.AIST)

Keywords:Electric-field Measurement, power device, NV center

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