[21a-235-1~8] 7.1 X-ray technologies

[21a-235-7] Exploration of scintillators for application of SX-STED method

〇Takeo Ejima¹, Syunsuke Kurosawa^2,6, Akihiro Yamaji³, Tadashi Hatano¹, Toshitaka Wakayama⁴, Takeshi Higashiguchi⁵, Mamoru Kitaura⁶ (1.IMRAM, Tohoku Univ., 2.NICHe, Tohoku Univ., 3.IMR, Tohoku Univ., 4.Saitama Med. Univ., 5.Utsunomiya Univ., 6.Yamagata Univ.)

Keywords:SX excited STED, scintillators, soft X-ray microscope

The STED method is one of the methods exceeding the diffraction limit of visible microscopes. Construction of an X-ray microscope that exhibits high spatial resolution with low cost will be possible by applying the STED method to a contact type soft X-ray microscope using a scintillator.
In this study, scintillators that show both high luminescent efficiency and STED phenomenon were investigated when the scintillator was excited by an soft X-ray (SX) light in the photon energy region from 250 eV to 1300 eV. Among the scintillators, the scintillators containing Eu- or Tb- atoms as the luminescent atom show the high luminescent efficiency and exhibit the several luminescent lines that have a possibility to show the SX excited STED phenomenon.