[21a-235-1~8] 7.1 X-ray technologies

[21a-235-8] Development of methodology for high-resolution X-ray phase CT using an X-ray microscope equipping with Lau interferometer

〇Hidekazu Takano¹, Koh Hashimoto¹, Yukinori Nagatani², Yanlin Wu¹, Koichi Matsuo³, Atsushi Momose¹ (1.Tohoku Univ., 2.NIPS, 3.Keio Univ.)

Keywords:X-ray microscopy, Phase CT, Grating interferometer

X-ray phase tomographic microscope, which can perform three-dimensional measurement in high spatial resolution and high sensitivity, has was developped by installing a Lau interferometer into an X-ray microscope using a laboratory based source. We will report improvement of the image quality by supressing artifacts by using iterative calculations.