[21p-135-1~16] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[21p-135-2] Development of Non-Destructive Surface States Density Measurement by Pulse Photoconductivity Method

〇Hiroki Matsuyama¹, Shotaro Kuzukawa¹, Narumi Abe¹, Yuki Kumagae¹, Yusuke Nakayama², Shunsuke Nakamura², Kotaro Nagatomo², Kazuhiro Kobayashi¹, Hiroshi Kubota¹, Takeshi Hashishin¹, Masao Yoshioka² (1.Graduate school of science and technology Kumamoto Univ., 2.Kumamoto Univ.)

Keywords:Interface level