The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

13 Semiconductors » 13.3 Insulator technology

[21p-145-1~14] 13.3 Insulator technology

Fri. Sep 21, 2018 1:15 PM - 5:00 PM 145 (Reception Hall)

Keisuke Yamamoto(Kyushu Univ.), Yasushi Hotta(Univ. of Hyogo)

4:45 PM - 5:00 PM

[21p-145-14] Accurate measurement of the internal potential in two capacitors connected in series for studying Negative Capacitance effects

〇(P)Xiuyan Li1, Tomonori Nishimura1, Akira Toriumi1 (1.Univ. of Tokyo)

Keywords:Negative Capacitance, Internal potential

The channel potential amplification by a ferroelectric(FE) gate oxide, namely a negative capacitance (NC) effect, needs to be experimentally verified before showing steep subthreshold swing. An accurate measurement of the internal potential at the floating node in two capacitors connected in series may provide a more direct evidence. In this paper, we discuss how to measure the internal potential and its significance on the NC demonstration so far reported.