The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[21p-223-1~12] 7.2 Applications and technologies of electron beams

Fri. Sep 21, 2018 1:15 PM - 4:30 PM 223 (223)

Yoichiro Neo(Shizuoka Univ.), Mitsunori Kitta(AIST)

4:00 PM - 4:15 PM

[21p-223-11] Improvements of a number of active tips in volcano structured Spindt-type field emitter arrays

Hidetoshi Shinya1,2, Takahiro Ikeda1, Hidekazu Murata1, Eiji Rokuta1, Hiroshi Shimoyama1, Masayoshi Nagao2, Katsuhisa Murakami2 (1.Meijo Univ., 2.AIST)

Keywords:Field emitter array, FEEM, Aging

We developed an electron optical instrument for evaluating multi-emitters. This device enables us to evaluate both the percentage of active tips and the stability of the emission current from each active tip. Herein, we employed the instrument to observe a volcano-structured Spindt-type field emitter array (FEA) in the photoelectron emission microscopy (PEEM) and field electron emission microscopy (FEEM) modes. Furthermore, we measured the emission current from each active tip in the FEA. Consequently, we found that the number of active tips in the FEA can be considerably increased by aging at a relatively high voltage.