The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[21p-232-1~18] 6.2 Carbon-based thin films

Fri. Sep 21, 2018 1:15 PM - 6:00 PM 232 (232)

Norio Tokuda(Kanazawa Univ.), Mariko Suzuki(CORNES Technologies Ltd.), Daisuke Takeuchi(AIST), Hisao Miyazaki(Toshiba)

4:00 PM - 4:15 PM

[21p-232-11] High on-current density and low on-resistance in Vertical-Type 2DHG Diamond MOSFET with Overlapping Gate Electrode Structure

〇(B)Jun Nishimura1, Masayuki Iwataki1, Nobutaka Oi1, Kiyotaka Horikawa1, Shoutaro Amano1, Taisuke Kageura1, Masafumi Inaba2, Atsushi Hiraiwa1,2, Hiroshi Kawarada1,3 (1.Waseda Univ., 2.Nagoya Univ., 3.Waseda ZAIKEN.)

Keywords:diamond, vertical-type, field effect transistor

We fabricated the vertical-type 2DHG diamond MOSFET with overlapping gate electrode structure, in order to reduce the source resistance and miniaturize the device. Compared to the general vertical-type diamond MOSFET, we confirmed that the current density・specific on-resistance characteristic was improved due to the achievement of miniaturization of the device area.