The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[21p-235-1~12] 7.1 X-ray technologies

Fri. Sep 21, 2018 1:30 PM - 4:45 PM 235 (3F_Lounge2)

Takeshi Higashiguchi(Utsunomiya Univ.), Takeo Ejima(Tohoku Univ.), Mitsunori Toyoda(Tokyo Polytechnic Univ.)

1:30 PM - 1:45 PM

[21p-235-1] X-ray stroboscopic phase-tomography based Talbot interferometer

Yanlin Wu1, Hidekazu Takano1, Karol Vegso2, Atsushi Momose1,2 (1.IMRAM, Tohoku Univ., 2.JASRI)

Keywords:Talbot interferometer, Stroboscope, Phase tomography

Talbot interferometer using synchrotron radiation white beam has been demonstrated for time-resolved X-ray phase imaging and tomography of dynamic phenomena. Stroboscopic X-ray phase imaging based on Talbot interferometer which are applicable to visualization of periodic processes in soft materials with µs order temporal resolution is reported.
We performed stroboscopic X-ray phase tomography with X-ray Talbot interferometer using white synchrotron radiation. Stroboscopic X-ray phase tomography was demonstrated for a sponge with concertina moving at 24 Hz with 10 mm stroke. The rotation stage was moved at 53 s per a three-turn and 212 projections were acquired to construct a tomogram at specific phases of motion. 12 phases of concertina movement of tomograms were generated.