[SP-23] Scienta Omicron, Inc.
TBD
Exhibitors
164 results (121 - 140)
[A-9] Semilab Japan
Thin Film Characterization, Electrical characterization of dielectrics and interfaces and Characterization of 3D structures for Semiconductors and PVs
[SP-19] SENTECH Instruments GmbH / Hakuto Co., Ltd.
1 Spectroscopic Ellipsometer 2 InSitu Ellipsometer 3 Atomic Layer Deposition System
[O-20] SIGMA TECH CO., LTD.
10nm Feedback Stage System, Vacuum 1nm Feedback Stage System
[M-5] Sigma-Aldrich Japan G.K.
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[L-5] Spectra-Physics
TBD
[A-2] Spectris Co., Ltd.
-
[SP-5] SPLEAD Corporation
-
[MEMS-3] SPP Technologies Co., Ltd.
-
[B-8] Springer Nature
Springer Journals, Springer eBooks and Print Books, SpringerMaterials, and Nano-a Nature Research Solution
[B-8] Springer Nature
Promotion of Nature Branded journals
[B-9] STRATEGIC Corporation
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[T-1] SUGA Co., ltd
Best solution of thin films [SAL1000 Desktop ALD Equipment]. It's small and easy installation.
[O-2] Sun Instruments, Inc.
TBD
[C-1] Systembrain Co., Ltd.
TBD
[O-11] SYSTEMHOUSE SUNRISE Inc.
1.I-V measurement system of perovskite solar cells. 2.Quantum efficiency measurement of perovskite solar cells. 3.C-V and C-F measurement of solar cells.
[O-14] T.E.M. Incorporated
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[E-8] TAIEI Engineering Co., LTD
Pico Ann Meter, Oxygen Monitor
[M-6] TANAKA KIKINZOKU KOGYO K.K.
Sputtering Target, Vapor Deposition Materials, Precious Metal Compounds, Precious Metal Colloids, Platinum Laboratory Instruments
[B-2] Taylor & Francis Asia Pacific
Books, Journals