Wnag Haibin¹, 〇Takaya Kubo¹, Nakazaki Jotaro², Segawa Hiroshi^1,2 (1.UTokyo RCAST, 2.UTokyo Graduate School of Atrs and Sciences)

〇(M2)Naoki Nakazawa¹, Yaohong Zhang¹, Hori Kanae¹, Shuzi Hayase^2,3, Taro Taro^1,3, Shen Qing^1,3 (1.Univ. Electro-commun, 2.Kyushu Inst. Tech, 3.JST CREST)

〇Taro Toyoda^1,4, Qing Shen^1,4, Kanae Hori¹, Naoki Nakazawa¹, Keita Kamiyama², Shuzi Hayase^3,4 (1.Univ. Electro-Commun., 2.Bunkoukeiki Co., Ltd., 3.Kyushu Inst.Tech., 4.JST-CREST)

〇Taro Toyoda^1,4, Qing Shen^1,4, Kanae Hori¹, Naoki Nakazawa¹, Keita Kamiyama², Shuzi Hayase^3,4 (1.Univ. Electro-Commun., 2.Bunkoukeiki Co., Ltd, 3.Kyushu Inst. Tech., 4.JST-CREST)

〇Kenji Katsumata¹, Kenichi Okada¹ (1.Fujikura Ltd.)

〇Daisuke Harada¹, Koji Kasahara¹, A.T.M.S. Islam¹, Ryo Ishikawa¹, Hajime Shirai¹ (1.Grad. School of Sci. & Eng., Saitama Univ.)

Tomoaki Ishitsuka¹, Nobuyuki Matsubayashi¹, 〇Toshihisa Tomie^1,2 (1.AIST, 2.CUST)

Bochao Li¹, Hao Li¹, Boyu Ji¹, Jinquan Lin¹, 〇Toshihisa Tomie^1,2 (1.CUST, 2.AIST)