[17a-B301-1~12] 15.1 Bulk crystal growth

[17a-B301-4] Analysis of dislocation embedded in Low-angle grain boundary in LiTaO₃ crystal (Ⅰ)
- Correspondence between X-ray topographic image and etch pit image -

〇Tomio Kajigaya¹, Yuta Kubouchi¹, Yutaka Ohno² (1.SMM, 2.IMR,Tohoku Univ.)

Keywords:Lithium Tantalate, dislocation, lineage

Structural analysis was performed on the lineage observed in the LT single crystal grown by the Cz method using the X-ray topography method and the etching method.