The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

17 Nanocarbon Technology » 17.2 Graphene

[17p-C202-1~15] 17.2 Graphene

Sat. Mar 17, 2018 1:45 PM - 5:45 PM C202 (52-202)

Atsushi Ando(AIST), Shohei Chiashi(Univ. of Tokyo)

4:45 PM - 5:00 PM

[17p-C202-12] Observation and analysis of multilayer graphene on nickel surface with scanning Auger electron spectrometer

Masahide Shima1, Hiroki Kato1, Kota Shihommatsu2, Yoshikazu Homma2 (1.JEOL Ltd., 2.Tokyo Univ. of Science)

Keywords:graphene, scanning Auger electron spectrometer

It is important to decide the number of layers of graphen, becase the physical property of graphene is depend on the number of layers. When we measrued the imaging by secondary electrons and elastic scattered electrons, the imaging contrast depending on the numbers of graphene was obtained. And we also discuss the peak intensity of elastic electrons and the peak shape of loss spectra.