The 65h JSAP Spring Meeting, 2018

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18a-F210-1~13] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Sun. Mar 18, 2018 9:00 AM - 12:30 PM F210 (61-210)

Satoshi Katano(Tohoku Univ.)

11:30 AM - 11:45 AM

[18a-F210-10] Investigation of carrier dynamics in organic thin-film transistors by time-resolved Kelvin-probe force microscopy without voltage modulation

〇Kouichi Innami1, Kei Kobayashi1, Hirofumi Yamada1 (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

Keywords:Time-resolved Electrostatic Force Microscopy