Degradation Mode Analysis of Crystalline Si PV Modules on Pressure Cooker Tests and Dynamic Mechanical Load Tests

Yuji Ino; Shuichi Asao; Katsuhiko Shirasawa; Hidetaka Takato

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.3 Bulk, thin-film and other silicon-based solar cells

[18p-D101-1~17] 16.3 Bulk, thin-film and other silicon-based solar cells

Sun. Mar 18, 2018 1:15 PM - 6:00 PM D101 (56-101)

Koji Arafune(Univ. of Hyogo), Fumitaka Ohashi(Gifu Univ.), Chikao Okamoto(Sharp)

3:45 PM - 4:00 PM

[18p-D101-10] Degradation Mode Analysis of Crystalline Si PV Modules on Pressure Cooker Tests and Dynamic Mechanical Load Tests

〇Yuji Ino¹, Shuichi Asao¹, Katsuhiko Shirasawa¹, Hidetaka Takato¹ (1.FREA, AIST)

Keywords:Crystalline Si PV Modules, reliability

Evaluation of the reliability of PV modules is important as they are used outdoors for a long time. We carried out PCT and DML tests for crystalline Si PV modules, and analyzed the degradation mode at the EL dark area by cross section SEM and EDX.