2:30 PM - 2:45 PM
△ [18p-E202-5] Leakage current analysis for dislocations in the modified Na-flux GaN single crystal
Keywords:Na flux GaN, Dislocation, Conductive atomic force microscopy
Oral presentation
15 Crystal Engineering » 15.4 III-V-group nitride crystals
Sun. Mar 18, 2018 1:15 PM - 7:30 PM E202 (57-202)
Tsutomu Araki(Ritsumeikan Univ.), Ryuji Katayama(Osaka Univ.), Hajime Fujikura(SCIOCS)
2:30 PM - 2:45 PM
Keywords:Na flux GaN, Dislocation, Conductive atomic force microscopy