A Study of Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices

Akifumi Maru; Akifumi Matsuda; Mamoru Yoshimoto

Presentation information

Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.1 Interdisciplinary and General Physics

[18p-F202-1~19] 1.1 Interdisciplinary and General Physics

Sun. Mar 18, 2018 1:15 PM - 6:30 PM F202 (61-202)

Makoto Omodani(Tokai Univ.), Chiemi Fujikawa(Tokai Univ.), Akihiro Matsutani(Titech)

5:15 PM - 5:30 PM

[18p-F202-15] A Study of Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices

〇(D)Akifumi Maru^1,2, Akifumi Matsuda¹, Mamoru Yoshimoto¹ (1.Tokyo tech, 2.JAXA)

Keywords:semiconductor, radiation, single event

To prevent the affect of charge sharing phenomenon, it is significantly important to estimate the area of charge distribution which generated by single radiation. The estimation techniques for charge sharing by using device simulator is proposed in this study.