The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[18p-F206-1~15] 6.2 Carbon-based thin films

Sun. Mar 18, 2018 1:45 PM - 6:00 PM F206 (61-206)

Tsuyoshi Yoshitake(Kyushu Univ.), Hitoshi Umezawa(AIST)

3:30 PM - 3:45 PM

[18p-F206-7] Vertical 2DHG Diamond MOSFET with improvement the structure for high breakdown voltage and miniaturization

〇(B)Masayuki Iwataki1, Nobutaka Oi1, Tsubasa Muta1, Kiyotaka Horikawa1, Syotaro Amano1, Masakuni Hideko1, Taisuke Kageura1, Masafumi Inaba2, Atsushi Hiraiwa1, Hiroshi Kawarada1,3 (1.Waseda Univ., 2.Nagoya Univ., 3.Waseda Zaiken.)

Keywords:Diamond, Vertical type device, MOSFET

We develop the Vertical 2DHG Diamond MOSFET which has trench with width 2~4 um, depth 4um. This device This device succeeded in obtaining high current density by miniaturization. And, we formed nitrogen doped layer to suppress the leakage current in the vertical direction, and obtained a high current on/off ratio. We formed nitrogen doped layer that has a structure alleviating electric field concentration by changing the concentration of the doped nitrogen. By alleviating concentration of electric field, the performance of dielectric breakdown voltage is expected to improve. From these reasons, we are planning to report the device that realize high current density and high breakdown voltage.