The 65h JSAP Spring Meeting, 2018

Presentation information

Symposium (Oral)

Symposium » The forefront of tip-enhanced Raman spectroscopy

[18p-F210-1~10] The forefront of tip-enhanced Raman spectroscopy

Sun. Mar 18, 2018 1:45 PM - 5:45 PM F210 (61-210)

Masamichi Yoshimura(Toyota Tech Institute), Yukiko Yamada-Takamura(JAIST)

5:00 PM - 5:15 PM

[18p-F210-8] Progress in Application of Tip Enhanced Raman Scattering Technique

Tomoko Numata1, Marc Chaigneau2 (1.HORIBA THECNO SERVICE, 2.HORIBA FRANCE)

Keywords:TERS, Graphene, Raman

Raman spectroscopy is an optical technique which provides chemical and crystalline information about material, but is limited by inherent weakness of Raman scattering and spatial resolution that is diffraction-limited(~0.5λ).
In research ,focused on carbon (graphene), various two dimension materials and semiconductors ,it is often desirable to expand spatial resolution beyond the diffraction limit with enhanced signal.
This is achieved by Tip-Enhanced Raman Spectroscopy.