[18p-P11-1~13] 12.2 Characterization and Materials Physics

[18p-P11-1] In situ XAFS study of electronic structure in EMIM TFST under electric field

〇Shiro Entani¹, Mitsunori Honda², Felix Tomilin³, Songtian Li¹, Hiroshi Naramoto¹, Pavel Avramov^3,4, Seiji Sakai¹ (1.QST, 2.JAEA, 3.Siberian Univ., 4.Kyungpook Univ.)

Keywords:XAFS, ionic liquid