[18p-P6-1~18] 13.2 Exploratory Materials, Physical Properties, Devices

[18p-P6-13] Measurement of time resolution photothermal divergences signal on Nitrogen-dopede SiC

〇Shinya Takeichi¹, Shintaro Harada¹, Shun Kamada², Weiwei Xu¹, Takanori Kozai¹, Takeshi Fujihara¹, Tao Zheng¹, Nobutomo Uehara³, Tomoya Konishi¹, Masaru Kamano¹ (1.NIT Anan College, 2.Tokushima Univ., 3.NIT)

Keywords:Silicon Carbide, photothermal divergences