[18p-P9-1~34] 3.12 Nanoscale optical science and near-field optics

[18p-P9-29] Investigation of hot electron visualization by Kelvin probe microscope

〇(M2)Tomotarou Ezaki¹, Akihiro Matsutani², Kunio Nishioka², Mina Sato², Takayuki Okamoto³, Toshihiro Isobe¹, Akira Nakajima¹, Sachiko Matsushita¹ (1.Dept. Mat. Sci. Eng., Tokyo Tech., 2.Technical Dept, Tokyo Tech., 3.RIKEN)

Keywords:KFM: Kelvin Probe Force Microscopy, Hot electron

This study aimed at direct observation and quantitative evaluation of electric field enhancement using Kelvin probe force microscope (KFM). Three types of gold nano disk array (monomers, dimers, tetramers) were prepared by electron beam lithography. We measure the surface potential under irradiation of light, and systematically discuss wavelength dependence, polarization dependence and sequence dependence. Changes in surface potential inherent in each structure were confirmed, and quantitative evaluation was attempted.