Reliability test of broadband QD ridge-waveguide laser diode in 1.0μm

Presentation information

Oral presentation

3 Optics and Photonics » 3.13 Semiconductor optical devices

Mon. Mar 19, 2018 9:00 AM - 11:45 AM B203 (53-203)

11:15 AM - 11:30 AM

〇Katsumi Yoshizawa¹, Yoshinori Sawado¹, Kouichi Akahane², Naokatsu Yamamoto² (1.pioneer MTC, 2.NICT)

Keywords:Quantum Dot, Semiconductor Laser Diode, Reliability