[19p-G201-1~10] Visualizing a brilliant future for Japanese semiconductor industry & Research

[19p-G201-2] Advanced Imaging Device Technologies and the Future for Sensing Technologies

〇Koji Neya¹, Hidenobu Tsugawa¹, Itaru Oshiyama¹, Yoshiki Ebiko¹, Keiji Tatani¹, Keiichi Ohno¹, Hiroyuki Miwa¹ (1.Sony Semiconductor)

Keywords:CMOS Image Sensor, Stacked CIS, Active Sensing

Back illuminated stacked CMOS image sensor (CIS) for Smartphone has been grown up to satisfy both of downsizing and high quality imaging. More recently, we have developed high frame rate CIS to suppress rolling shutter distortion and near-Infrared high sensitivity CIS for active sensing. Therefore, we explain trend and future imaging device technologies for conventional uses and new sensing applications.