[19p-G202-1~12] 12.2 Characterization and Materials Physics

[19p-G202-12] Development of Angle-Resolved Low Energy Inverse Photoelectron Spectroscopy Apparatus

〇(M1)Satoshi Ideta¹, Yuki Kashimoto¹, Haruki Sato¹, Hiroyuki Yoshida^1,2,3 (1.Chiba Univ., 2.Chiba Univ., 3.Molecular Chirality Chiba Univ.)

Keywords:low energy inverse photoelectron spectroscopy, energy dispersion, organic semiconductor

In 2012, we developed low energy inverse photoelectron spectroscopy (LEIPS) which enabled us to measure unoccupied states of organic semiconductors precisely. In this study, we developed angle-resolved LEIPS apparatus aiming at measuring energy dispersion of unoccupied states of organic semiconductors. The big issue in angle-resolved measurement of LEIPS is handling low energy electron beam (2 -5 eV in energy) with small angle and energy spreads. We developed low energy electron source for this purpose. Further, stray electric and magnetic fields were carefully shielded. As a result, we successfully observed energy dispersion of image potential state of highly oriented pyrolytic graphite (HOPG) using angle-resolved mode of LEIPS.