The 65h JSAP Spring Meeting, 2018

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7 Beam Technology and Nanofabrication » 7.5 Ion beams

[20a-B403-1~10] 7.5 Ion beams

Tue. Mar 20, 2018 9:00 AM - 11:45 AM B403 (53-403)

Toshio Seki(Kyoto Univ.), Junichi Yanagisawa(Univ. of Shiga Pref.)

11:30 AM - 11:45 AM

[20a-B403-10] Development of Ambient SIMS for Analysis of Solid-Liquid Interface

〇(M2)Kenta Ishii1, Toshio Seki1, Takaaki Aoki2, Jiro Matsuo1 (1.Graduate School of Engineering, Kyoto Univ., 2.ACCMS, Kyoto Univ.)

Keywords:Secondary Ion Mass Spectrometry