11:30 AM - 11:45 AM
[20a-B403-10] Development of Ambient SIMS for Analysis of Solid-Liquid Interface
Keywords:Secondary Ion Mass Spectrometry
Oral presentation
7 Beam Technology and Nanofabrication » 7.5 Ion beams
Tue. Mar 20, 2018 9:00 AM - 11:45 AM B403 (53-403)
Toshio Seki(Kyoto Univ.), Junichi Yanagisawa(Univ. of Shiga Pref.)
11:30 AM - 11:45 AM
Keywords:Secondary Ion Mass Spectrometry