09:00 〜 09:15
▲ [20a-D104-1] Effect of Be Doping on the Electronic Structure of n-Type Ferromagnetic Semiconductor (In,Fe)As
キーワード:Ferromagnetic semiconductor, Electronic structure, Resonant inelastic x-ray scattering
n-type ferromagnetic semiconductor (In,Fe)As:Be shows ferromagnetic property depending on carrier concentration, where the Be dopants act as double donor. In this work, to investigate the effects of Be doping on the electronic structure of (In,Fe)As, we have performed resonant inelastic X-ray scattering (RIXS) measurements on (In,Fe)As:Be thin films. There are clear differences of the Fe 3d RIXS spectra between (In,Fe)As thin films with and without Be doping, although the Be concentration proportional to the carrier concentration is of the order of 1019 cm-3. This result suggests that the Be doping not only provides carriers to (In,Fe)As, but also strengthens the hybridization between the Fe 3d and the InAs bands.