[20p-A304-1~12] 2.2 Detection systems

[20p-A304-12] Development of an ultra-high-resolution multi-probe CdTe SPECT imager: Image reconstruction

〇Tadashi Orita¹, Shin'ichiro Takeda¹, Ryota Tomaru^2,3, Fumiki Moriyama¹, Hirotaka Sugawara¹, Miho Katsuragawa^2,3, Goro Yabu^2,3, Shin Watanabe^2,3, Tadayuki Takahashi^2,3, Riyo Zochi⁴, Hiroshi Mizuma⁴, Yousuke Kanayama⁴ (1.OIST, 2.ISAS/JAXA, 3.Univ. of Tokyo, 4.RIKEN)

Keywords:semiconductor, CdTe, SPECT