The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[20p-B301-1~13] 7.1 X-ray technologies

Tue. Mar 20, 2018 1:15 PM - 4:45 PM B301 (53-301)

Mitsunori Toyoda(Tohoku Univ.), Takashi Imazono(QST), Norio Watanabe(Univ. of Tsukuba)

4:30 PM - 4:45 PM

[20p-B301-13] Phase correction in XAFS analysis: Atomic distance evaluation by a model-free method

Masashi Ishii1 (1.NIMS)

Keywords:X-ray absorption, phase shift, Radial structure function

In conventional XAFS analysis, experimentally obtained oscillation structure is Fourier-transformed to the real-space, and following that, a fitting assuming a local structure is performed to obtain an atomic distance. The structure assumption is obviously disadvantage for objective analysis. In this report, we propose a new technique in which the atomic distance can be directly evaluated with mathematical process without structure model.