[20p-B301-1~13] 7.1 X-ray technologies

△ [20p-B301-3] Direct Measurement of the Charge Cloud Shape Produced in SOI Pixel Detector for X-ray Use

〇(M2)Yuichi Kojima¹, Junko S. Hiraga¹, Takeshi G. Tsuru² (1.Kwansei Gakuin Univ., 2.Kyoto Univ.)

Keywords:X-ray, Charge Cloud, Sub Pixel

The X-ray imaging spectrometer, “XRPIX” has been developed for next generation X-ray Astronomy using SOI technology. We performed “multi-collimator experiment” to investigate the signal charge behavior inside the XRPIX with sub-pixel resolution. The multi-collimator, manufacture by microworks GmbH, is made by 80um-thick gold plate in which small pin holes of 4um in diameter are periodically spaced by each 60um. The multi-collimator was placed just above XRPIX surface and pseudo parallel X-ray beam are irradiated. The charge cloud shape produced by an X-ray photon of ~10keV inside the XRPIX was directly measurement and we reproduced Gaussian function. The resultant size of charge cloud , we derived, are 5.4um and 3.3um as a standard deviation for horizontal axis and vertical axis, respectively.