Toshiki Matsue

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Speaker, Author, Co-Author

Thu. Sep 19, 2019 10:00 AM - 11:45 AM C213 (C213)

Oral presentation
| 2 Ionizing Radiation
| 2.2 Detection systems

[19a-C213-1~7] 2.2 Detection systems

11:30 AM - 11:45 AM

[19a-C213-7] Sensitivity improvement of line detector for backscattered X-ray inspection

〇Toshiki Matsue¹, Atsushi Yamazaki¹, Kenichi Watanabe¹, Sachiko Yoshihashi¹, Akira Uritani¹, Hiroyuki Toyokawa², Takeshi Fujiwara², Shinichi Mandai³, Hidenori Isa³ (1.Nagoya Univ., 2.AIST, 3.BEAMX Corp)

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