Symposium (Oral)

[19a-B31-1~5] New development of surface and interface evaluation methods for thin films

Thu. Sep 19, 2019 9:00 AM - 11:45 AM B31 (B31)

Yoshinobu Nakamura(Univ. of Tokyo), Tomoki Abe(Tottori Univ.)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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9:00 AM - 9:15 AM

[19a-B31-1] Introductory Talk

〇Tetsuo Tsuchiya¹ (1.AIST)

9:15 AM - 10:00 AM

[19a-B31-2] Recent Interests in Functional Oxide Thin Films -Topics on Surface and Interface-

〇Hitoshi Tabata¹ (1.Univ. of Tokyo)

10:00 AM - 10:45 AM

[19a-B31-3] Interface Properties and Electronic Device Applications of Oxide Heterostructures

〇Akihito Sawa¹, Hiroyuki Yamada¹ (1.AIST)

11:00 AM - 11:30 AM

[19a-B31-4] Characterization of functional thin film materials by X-ray diffraction techniques

〇Katsuhiko Inaba¹ (1.Rigaku Corp.)

11:30 AM - 11:45 AM

[19a-B31-5] The characteristics of microstructure of very thin metal-oxide films deposited on amorphous glass substrates on the basis of X-ray analysis

〇Tetsuya Yamamoto¹, Hisashi Kitami^1,2, Yutaka Furubayashi¹, Junichi Nomoto³ (1.Kochi Univ. Tech., Res. Inst., 2.Sumitomo Heavy Indus. Ltd., 3.AIST)

Symposium (Oral)

[19p-B31-1~8] New development of surface and interface evaluation methods for thin films

Thu. Sep 19, 2019 1:15 PM - 5:15 PM B31 (B31)

Toshiyuki Kawaharamura(Kochi Univ. of Tech.), Hiroaki Nishikawa(Kindai Univ.)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:15 PM - 1:45 PM

[19p-B31-1] Relationships between Chemical Bonding in Oxide Ferroelectrics and Characteristics of their Aerosol Deposition

〇Yoshihiro KUROIWA¹ (1.Hiroshima Univ.)

1:45 PM - 2:15 PM

[19p-B31-2] New Developments on Hard X-ray Photoelectron Spectroscopy:Resonance Measurements and Electronic State Observation of Solutions

〇Eiji Ikenaga^1,2, Yasui Akira², Masaichiro Mizumaki², Naomi Kawamura², Satoshi Tsutsui², Naoki Kanayama^3,4, Kojiro Mimura⁵ (1.Nagoya Univ. IMaSS, 2.JASRI, 3.RIKEN, 4.Shinshu Univ., 5.Osaka Pref. Univ.)

2:15 PM - 2:45 PM

[19p-B31-3] Electronic Structure Analysis of Magnetic Semiconductor Thin Films Using Soft X-Ray Spectroscopy

〇Masaki Kobayashi^1,2 (1.EEIC, Univ. of Tokyo, 2.CSRN, Univ. of Tokyo)

2:45 PM - 3:15 PM

[19p-B31-4] Analyses of surface and interfacial electronic states in magnetic thin films by using x-ray magnetic circular dichroism

〇Goro Shibata¹ (1.Tokyo Univ. of Science)

3:30 PM - 4:00 PM

[19p-B31-5] Optical Characterization of Nitride-semiconductor-based Nano-structures
by Scanning Near-field Optical Microscopy

〇Yoichi Kawakami Kawakami¹ (1.Kyoto Univ.)

4:00 PM - 4:30 PM

[19p-B31-6] Evaluation of surfaces and interfaces of semiconductors using THz emissions

〇Iwao Kawayama¹ (1.Osaka Univ.)

4:30 PM - 5:00 PM

[19p-B31-7] The state and application of HR-RBS analysis

〇Tetsuya Kogita¹ (1.Kobelco Research Institute)

5:00 PM - 5:15 PM

[19p-B31-8] Closing Remarks

〇Tetsuya Yamamoto¹ (1.Kochi Univ. of Tech.)

Sessions

Symposium (technical) » New development of surface and interface evaluation methods for thin films