The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18a-C310-1~10] 6.6 Probe Microscopy

Wed. Sep 18, 2019 9:30 AM - 12:15 PM C310 (C310)

Masayuki Abe(Osaka Univ.)

12:00 PM - 12:15 PM

[18a-C310-10] Photoresponse measurement of monolayer WSe2/MoSe2 in-plane heterostructure by a photo excited multiprobe technique

Hiroyuki Mogi1, Zi-han Wang1, Takafumi Bamba1, Yuhei Takaguchi2, Takahiko Endo2, Shoji Yoshida1, Atsushi Taninaka1, Haruhiro Oigawa1, Yasumitsu Miyata2, Osamu Takeuchi1, Hidemi Shigekawa1 (1.Univ. of Tsukuba, 2.Tokyo metro univ.)

Keywords:Transition metal dicalcogenides, Multiprobe technique, Photocarrier dynamics

In recent years, transition metal dichalcogenides (TMDC) family such as MoS2 and WSe2 has attracted much attention due to their remarkable optoelectronic properties. For the first time in the world, we succeed to combine multiprobe techniques with femto-second pulsed laser system. By using the multiprobe optical method, we measured WSe2/MoSe2 in-plane heterostructure on SiO2/Si substrate. As a result, we evaluated the band structure including the schottkey barrier of probe-sample interface and band shift on MoSe2/WSe2 interface and positional dependence of carrier dynamics. This technique is expected to play an important role in the researches to develop advanced functional devices with microscopic structures.