The 80th JSAP Autumn Meeting 2019

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18a-C310-1~10] 6.6 Probe Microscopy

Wed. Sep 18, 2019 9:30 AM - 12:15 PM C310 (C310)

Masayuki Abe(Osaka Univ.)

9:45 AM - 10:00 AM

[18a-C310-2] Direct imaging of frequency response by dual bias modulation electrostatic force microscopy

〇(DC)Ryota Fukuzawa1, Takuji Takahashi1,2 (1.IIS, The Univ. Tokyo, 2.NanoQuine)

Keywords:electrostatic force microscopy, atomic force microscopy, CIGS