[18a-E302-1~12] 12.2 Characterization and Materials Physics

[18a-E302-1] FM-AFM analysis on structuring of interfacial IL close to the step of different depth prepared on graphite basal plane

〇Ryotaro Namba¹, Masaki Yonekawa¹, Shengkai Xue², Ichiro Tanabe¹, Akira Sasahara², Hiroshi Onishi², Ken-ichi Fukui¹ (1.Osaka Univ., 2.Kobe Univ.)

Keywords:FM-AFM, Ionic liquid, graphite

Nonflammable and chemically stable properties of ionic liquids (ILs) are attractive for their application to electric devices such as a secondary battery and an electric double layer capacitor. However, the structuring of the IL faced to solid materials sometimes cause problems on the efficiency of such devices. To examine how the local structure of the solid electrode affects the structuring of the interfacial IL, holes with regulated depth and size were prepared on graphite by heat treatment under Ar flow, and position dependent structuring of an IL (BMIM-TFSI) close to the edge of the different depths was analyzed by two-dimensional frequency shift mapping using frequency modulation atomic force microscopy (FM-AFM). Characteristic maps were obtained suggesting the different structuring of the interfacial IL particularly depending on the depth of the hole.We will discuss how the structuring of interfacial IL differs at the flat terrace region, close to the hole edge, and inside the hole and how the hole depth affects IL structuring.