[18a-E302-1~12] 12.2 Characterization and Materials Physics

△ [18a-E302-9] Kelvin probe study on interface properties of solution-processed alkyl-substituted phthalocyanine thin film

〇Ryo Ishiura¹, Akihiko Fujii¹, Makoto Arita², Koichi Sudoh³, Masanori Ozaki¹ (1.Osaka Univ., 2.Kyushu Univ., 3.ISIR Osaka Univ.)

Keywords:organic semicoductor, Phthalocyanine, Kelvin probe microscopy

It is important to clarify the interface properties of solution-processed organic semiconductor thin films for electronic device application. In this study, an alkyl-substituted phthalocyanine single crystalline thin film with molecular step / terrace structure was prepared on n-Si substrate, and succeeded in elucidating the interface properties by using Kelvin probe microscopy. The surface potential was dependent on the film thickness, and the change exceeding 0.4 V was observed. It was also found the linear and non-linear relationships between the surface potential and film thickness, that were interpreted to appear owing to the vacuum level shift and band bending.