The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

[18a-E310-1~10] 15.4 III-V-group nitride crystals

Wed. Sep 18, 2019 9:00 AM - 11:45 AM E310 (E310)

Mitsuru Funato(Kyoto Univ.), Yoshiki Saito(TS Opto)

10:00 AM - 10:15 AM

[18a-E310-5] [Young Scientist Presentation Award Speech] Improvement of quality in AlGaN underlying layer by growth mode control and its application to UV-B laser

Yuta Kawase1, Junnya Ikeda1, Yusuke Sakuragi1, Shinji Yasue1, Shohei Teramura1, Shunnya tanaka1, Yuya Ogino1, Motoaki Iwaya1, Tetsuya Takeuchi1, Satoshi Kamiyama1, Sho Iwayama1,3, Isamu Akasaki1,2, Hideto Miyake3 (1.Department of Materials Science and Engineering, Meijo University, Nagoya, Japan, 2.Akasaki Research Center, Nagoya University, Nagoya, Japan, 3.Graduate School of Regional Innovation Studies, Mie University, Tsu, Japan)

Keywords:AlGaN, laser

In this report, AlGaN with a thickness of about 60% of AlN mole was deposited on a high-temperature-treated sputter AlN film with different surface flatness. As a result, there was a difference in the growth mode.
It was also confirmed that the difference in the growth mode of AlGaN was influenced by the crystallinity of the underlying AlN layer.
The active layer was stacked on the AlGaN and the laser characteristics were investigated by photo-excitation method.
The threshold excitation power density of the samples using three-dimensionally grown AlGaN was about 1/6 lower than that of the samples using the two-dimensional grown AlGaN, and decreased to 36 kW / cm2.