Keywords:NV center, Scanning probe microscope, Magnetic domain wall
In spintronics, a device utilizing magnetic domain wall motion has been proposed, and a novel tool to detect their magnetic properties at the nanoscale is required. Recently, a defect structure formed with substituted nitrogen atom and vacancy at the nearest neighbor sites in diamond; so-called NV center, has been expected as a novel nanoscale magnetometer. Magnetic resonance signal can be detected optically (ODMR) from the NV center, and stray field detection and imaging from magnetic materials can be performed monitoring Zeeman splitting signal. In this work, detection of the stray field from the magnetic domain of a garnet sample was investigated by using a scanning NV magnetometer combined with atomic force microscopy.